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Services

Hi-Rel Laboratories specializes in the analysis and testing of microelectronics and materials technology. With our unwavering commitment to precision and expertise, we offer a comprehensive range of services that harness the power of testing and advanced analytical techniques. Whether you require detailed material analysis, failure investigations, or quality control assessments, our team of skilled professionals leverages a vast array of tools and technologies to uncover the smallest details and provide accurate insights.

Destructive Physical Analysis

Failure Analysis

Materials Analysis

Counterfeit Detection

Real Time X-Ray

3D CT X-Ray / Laminography 

Acoustic Microscopy (SAM)

Focused Ion Beam Sectioning (FIB)

Scanning Electron Microscopy (SEM)

Energy Dispersive Spectroscopy (EDS)

Fourier Transform Infrared (FTIR)

Optical Microscopy

Prohibitive Materials Analysis (PMA)

Particle Impact Noise Detection (PIND)

Hermeticity

(Fine and Gross Leak)

Delid/ Decap/ Laser Ablation

Visual Inspection

(Internal and External)

Bond Pull

Die Shear

Color Dot Identification

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Infrared Hot Spot Detection

Cross Section

Physical Dimensioning

Energy Dispersive X-Ray Fluorecence (EDXRF)

Wafer Lot Acceptance Testing (WLAT)

SEM Qualification

Precision Metallographic Examination

Laser Induced Breakdown Spectroscopy (LIBS)

Component Types

Microelectronic components are the building blocks of modern technology, driving innovation and revolutionizing industries. At Hi-Rel Laboratories, we recognize the immense significance of these miniature wonders and offer expertise in the testing and analysis of their performance.

P.E.M.s, P.E.T.s, P.E.D.s

Transistors

Integrated Circuits

Diodes 

(Glass or Metal Can)

Switches

Capacitors

Magnetics

(Inductor/ Transformer)

Relays

Thermistors 

Crystals

Resistors

Fuses

Connectors

Hybrids

Heaters

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