Leaders in microelectronic testing and analysis since 1972
Come see us at CMSE
We will be at the upcoming 27th Annual Components for Military & Space Electronics conference & exhibition between April 30 and May 2 2024 in Los Angles, California. Come by our booth and see what we have in store!
For over 50 years, our physical analysis of semiconductors has been a trusted resource for companies around the world. We now offer a new division specializing in counterfeit detection. Our team has the experience and expertise to ensure your components are up to industry standards and free of counterfeit materials.
Destructive Physical Analysis (DPA)
Hi-Rel has been the industry leader in DPA testing since 1973, supporting the defense and aerospace industries. We are experts in evaluating all component types. Regular participants on industry working groups that define test requirements for microelectronic components.
Materials Analysis (MA)
Hi-Rel specializes in evaluating microelectronic components, materials and associated processes. Using proven analytical techniques, both destructive and non-destructive, we can help with your material-related needs
Upgrade Services (NDT)
Hi-Rel offers non-electrical test upgrade services including Particle Impact Noise Detection (PIND), digital real-time radiography, hermeticity testing, Scanning Acoustic Microscopy (SAM) and color dot marking. All operations are performed in our ESD protected work area with bonded device storage
Failure Analysis (FA)
Performing failure analysis on electronic devices and assemblies since 1972, Hi-Rel has vast experience in assisting customers with their root cause investigations, from passive components to custom hybrids.