Leaders in microelectronic testing and analysis since 1972
For over 50 years, our physical analysis of semiconductors has been a trusted resource for companies around the world. We now offer a new division specializing in counterfeit detection. Our team has the experience and expertise to ensure your components are up to industry standards and free of counterfeit materials.
Destructive Physical Analysis (DPA)
Hi-Rel has been the industry leader in DPA testing since 1973, supporting the defense and aerospace industries. We are experts in evaluating all component types. Regular participants on industry working groups that define test requirements for microelectronic components.
Upgrade Services (NDT)
Hi-Rel offers non-electrical test upgrade services including Particle Impact Noise Detection (PIND), digital real-time radiography, hermeticity testing, Scanning Acoustic Microscopy (SAM) and color dot marking. All operations are performed in our ESD protected work area with bonded device storage